Tape Storage

  Tape Library
  Tape Drives
 - T9840 Tape Drives
 - T9940 Tape Drives
 - LTO Ultrium Tape Drives
 - SDLT Tape Drives
 - DLT 8000 Tape Drives
  Tape Media
  Tape Management
Disk Storage
Storage Networking
Storage Management
Ultrium tape drives
 
The LTO Ultrium® Generation 2 tape drive stores up to 200 gigabytes of native data on a single cartridge. The LTO Ultrium Generation 1 drive accommodates up to 100 gigabytes per cartridge. These high capacity drives work in tandem with available Fibre Channel interfaces to help manage rapid data growth in a cost-effective manner.
 
Spec Summary
  LTO Gen 2 LTO Gen 1
Capacity, native (uncompressed) IBM: 200 GB
 
100 GB
 
Interface: Single port Ultra 3 SCSI
 
Single port Ultra 2 SCSI, 68 pin female connector
 
Data transfer rate, native (uncompressed) HP: (HP) 30 MB/sec (1)
(IBM) 35 MB/sec (1)
(HP) 15 MB/sec (1)
(IBM) 15 MB/sec (1)
(Certance) 16 MB/sec (1)
 
 
Applications
Disaster recovery
LTO Ultrium tape drives are an integral part of site-wide disaster recovery processes that remotely vault data in tape form for recovery in case of disaster. Tapes can be physically transported to a remote site, created electronically with LTO Ultrium tape drives in a library at the remote location, or created simultaneously at both locations.
Backup and restore
Using LTO Ultrium tape drives accelerates backup and restore processes by processing more data in less time. LTO Ultrium tape drives’ high capacity reduces mount and dismount frequency. LTO Ultrium drives can be used in combination with other drives to tune backup and restore performance and capacity to specific needs.
Archiving
LTO Ultrium tape drives are a practical choice for archiving growing volumes of business data. The high capacity and transfer rates of LTO Ultrium tape drives shorten recall times and support aggressive archival growth rates.
 
Benefits
Enhanced data protection
Powerful correction and verification capabilities protect data integrity and prevent data loss. The LTO Ultrium Generation 2 drives are rated for more than 100,000 loads and unloads and one million tape passes before failure.
Exceptional performance
Capabilities such as dynamic rate matching and dual mode compression enhance tape drive performance and product life.
Reduced backup windows
The capacity and throughput performance of LTO Ultrium technology enables you to accelerate backups by processing more information within limited windows. The LTO Ultrium Generation 2 drive moves data at rates as high as 35 megabytes per second.
Cost-effective capacity
With the ability to store up to 200 gigabytes of native data on a single cartridge, you can reduce your media costs and tape counts while accommodating data growth.
 
Features
Standard features:
SAN-readiness
With native two-gigabit Gb Fibre Channel interfaces, StorageTek’s LTO Ultrium Generation 2 tape drives are ready for direct connection to high-performance SANs.
Technical compatibility
These drives are compatible with StorageTek L-Series™ tape libraries and leading backup and management software. LTO Ultrium Generation 2 drives offer backward read and write compatibility with Generation 1 drives.
Connectivity choices
StorageTek’s LTO Ultrium Generation 2 drives are available with SCSI or native Fibre Channel interfaces, so you can select the right connectivity and transfer speed for your needs.
Drive choices
StorageTek offers and supports LTO tape drives from HP, IBM and Seagate. This range of choices enables you to pick the ideal drive for your environment.
Options:
Tape drive vendor
LTO Ultrium Generation 2 : HP, IBM
LTO Ultrium Generation 1 : HP, IBM, Certance
 
Specifications
  Performance
    LTO Gen 2 LTO Gen 1
  Access time*  
  Tape load and thread to ready: (HP) 19 sec
(IBM) 15 sec
 
(HP) 25 sec
(IBM) 27 sec
(Certance) 10 sec
 
  Maximum/average rewind time: (HP) 104/52 sec
(IBM) 98/49 sec
 
(HP) 142/71 sec
(IBM) 110/55 sec
(Certance) 152/76 sec
 
  Unload Time: (HP) 13 sec
(IBM) 15 sec
 
(HP) 13 sec
(IBM) 15 sec
(Certance) 13 sec
 
  Data transfer rate, native (uncompressed) HP: (HP) 30 MB/sec (1)
(IBM) 35 MB/sec (1)
 
(HP) 15 MB/sec (1)
(IBM) 15 MB/sec (1)
(Certance) 16 MB/sec (1)
 
  Capacity
    LTO Gen 2 LTO Gen 1
  Capacity, native (uncompressed) IBM: 200 GB
 
100 GB
 
  Availability
    LTO Gen 2 LTO Gen 1
  Mean time between failures (MTBF)  
  Power on: 250,000 hr @ 100% duty cycle
 
250,000 hr @ 100% duty cycle
 
  Head life: 60,000 hr
 
30,000 hr
 
  Uncorrected bit error rate: 1x10(-17)
 
1x10(-17)
 
  Undetected bit error rate: 1x10(-27)
 
1x10(-27)
 
  Compatibility
    LTO Gen 2 LTO Gen 1
  Interface  
  Interface: Single port Ultra 3 SCSI
 
Single port Ultra 2 SCSI, 68 pin female connector
 
  Burst transfer rate: LVD 160 MB/sec
 
LVD 80 MB/sec, HVD 40 MB/sec
 
  Channel rate (Fibre Channel): 200 MB/sec (maximum instantaneous)
 
N/A
 
  Interface : N & NL port, FC-PLDA (Hard and soft AL-PA capability), FC-AL-2 FCP-2, FC-TAPE
 
NL_Port, FC-PLDA (hard and soft AL-PA capability), FC-AL, FCP-2, FC-TAPE
 
  Read/write compatibility interface: Ultrium 2, Ultrium proprietary format
 
Ultrium proprietary format
 
  Mechanical
    LTO Gen 2 LTO Gen 1
  Form factor: 5.25 in (full height) 8.0 in (full length)
 
5.25 in (full height) 8.0 in (full length)
 
  Environmental
    LTO Gen 2 LTO Gen 1
  Temperature  
  Operatin: (HP) +50° to +104° F (+10° to +40° C )
(IBM) +50° to +100° F (+10° to +38° C )
 
(HP) +50° to +95° F (+10° to +35° C )
(IBM) +50° to +104° F (+10° to +40° C )
(Certance) +50° F to +104° F (+10° to +40° C )
 
  Non-operating: (HP) -40° F to +150° F (-40° C to +66° C )
(IBM) -40° F to +139° F (-40° C to +66° C )
 
(HP) -40° to +150° F (-40° to +66° C )
(IBM) -40° to +140° F (-40° to +66° C )
(Certance) -40° to +140° F (-40° to +66° C )
 
  Humidity  
  Operating: 20%–80%
 
20%–80%
 
  Non-operating: 10%–95%
 
10%–95%
 
  Power
    LTO Gen 2 LTO Gen 1
  Voltage (L5500): 220–240 VAC @ 50–60 Hz
 
220–240 VAC @ 50–60 Hz
 
  Voltage (L180 / L700e): 100–240 VAC @ 50–60 Hz
 
100–240 VAC @ 50–60 Hz
 

Copyright © 2003 [Millennia Infokom Technologi]. All rights reserved.
Revised: December, 2003